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Jitter & Phase Noise Applications

Digital designers are being asked to deliver chip sets, plug-in cards, and PC board bus designs with smaller timing budgets. These smaller budgets require the use of high quality noise sources to model real world signal disturbances (jitter), to provide information about BER. The new J7000 series instruments are designed for the latest serial data jitter applications, including PCI express, Serial ATA, and Fiber Channel. Whether looking in the time domain for jitter, or the frequency domain for phase noise, the new J7000 series can provide a high crest factor, Gaussian amplitude distribution noise output for your test requirements. For specific serial data applications including PCI express, Gen I & II, the J7000 series can be used as a random jitter (Rj) source as documented in the PCISIG total jitter (Tj) model. The standard J7000 models can be custom designed for multiple specifications with additional sources, combiners, and specialized filters. Although the J7000 series is designed for jitter, and phase noise applications, other instruments can be used for this purpose (see the product links). For additional information about this topic please contact Noise Com


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