MTTS 2014 Noisecom JV9000 Demonstration

Abstract

Demonstrate the effect of additive white Gaussian noise (AWGN) and spurious signals riding on supply voltage of a PLL/VCO circuit using JV9000 to inject AWGN and CW tones on its Vcc.

Noise on Vcc of PLL/VCO

Measure impact of noise and spurs on Vcc of PLL/VCO circuit

Noisecom JV9000 Demonstration

Product: 
Demonstrate the effect of additive white Gaussian noise (AWGN) and spurious signals riding on supply voltage of a PLL/VCO circuit using JV9000 to inject AWGN and CW tones on its Vcc.     

Target Users:
Signal integrity, IC design and evaluation engineers characterizing and quantifying the performance of their IC or PCB circuit in the presence of noise and spurious signals on the Vcc of their circuit.  Application circuits and ICs include but not limited to low voltage high speed ICs, PLL/VCO, XO, PLL/VCXO, ADC, DAC and SERDES.

Test Set-up:
MTTS 2014 Noisecom JV9000 Demo

About JV9000:
JV9000 adds AWGN and CW tones into the power supply line in 0.1 dB steps to emulate effects of noise generated by various sources including switching power supplies, ground bounce, Vcc droop, and interference from other adjacent circuits coupling onto the Vcc. User can determine impedance characteristics of the Vcc trace and supply voltage plane on a PCB by as well.  JV9000 is specifically designed to test components that need to be qualified for immunity to specific interference levels and is ideal to analyze Power Supply Rejection Ratio (PSRR).   

Significant Features of JV9000:
  • 0.1 dB resolution in noise and CW injection.
  • Custom noise frequency bands and power levels to support various test scenarios.
Measuring effect of Noise and spurs on power supply of PLL/VCO circuit:
PLL/VCO IC eval board is modified as a test board for the demo set-up.  The output of the PLL/VCO is monitored by a phase noise analyzer to measure the increase in the overall phase noise when AWGN and/or discrete CW tones are injected to the Vcc of the eval board.  By injecting broadband noise we are able to measure the increase in overall phase noise level over a wide band range of frequencies by applying one signal.  The figure below shows an increase in phase noise from 1 KHz to 3 MHz. We are also able to inject CW tones at select frequencies to measure spur rejection of the test circuit.  

MTTS 2014 Noisecom JV9000 Demo
MTTS 2014 Noisecom JV9000 Demo

Existing and Comparable Products:

JV9000 integrates individual components of "home grown solutions" into a remote controllable instrument, making repeatable measurements easier and faster.