Wireless Telecom Group Introduces Noisecom VCC Noise and Spur Generator for Immunity Measurements and Specifications of Integrated Circuits

Posted January 22, 2013

Noisecom, a Wireless Telecom Group company (NYSE: WTT), has launched its new JV9000 series, a family of Programmable  and Adjustable VCC Noise and Spur Generators.

Noise disturbance on Ground and Vcc planes is an increasing concern for component designers. Switching power supplies are one known culprit for power level impurities, but fast switching digital outputs also introduce unwanted noise. Whether developing or operating highly accurate PLL and clock circuits, A/D D/A converters, other linear precision circuits, Ground and VCC noise can significantly influence system functionality especially with ever decreasing supply rail voltages.

"Noisecom’s new JV9000 generator is designed to test components that need to be qualified for VCC and GND noise interference immunity. Our generator has the capability to inject both, wideband noise and deterministic jitter (DJ) signals in a very controlled and precise manner”, said Murat Eron, VP of Engineering at WTG. “Leading chip manufacturers have shown much interest in the JV9000 as a way to establish a standardized and repeatable procedure in testing their designs for the best VCC noise immunity". 

JV9000 generators are available as manual or computerized instruments, capable of delivering broadband noise from 500 Hz to 2 GHz at levels from 0.01 mV to 224 mV RMS (into 50 Ohms). JV9000 simulates DJ interferers within a signal frequency range from 1 kHz to 0.5 GHz (in steps). Customized input and output channels, as well as spur ranges and levels are available on request.  JV9000 generators are available immediately.

See a demo of the JV9000 at our upcoming tradeshow, DesignCon 2013, Booth#726.
For more information please visit our site:
https://fuel180.noisecom.com/products/instruments/jv9000-series-adjustable-vcc-noise-generator-for-psrr-analysis

Read about our Success Story at:
https://fuel180.noisecom.com/resource-library/success-stories/story/artmid/1870/articleid/1200/global-chip-developer-uses-noisecom-vcc-solution-to-integrate-noise-sources-into-their-test-system