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Noisecom Launches New Compact Form Factor RFX7000B Programmable Noise Generator for Automated Testing and Rack Mount Environments

May 27, 2020

Parsippany, New Jersey, USA – May 27, 2020 – Noisecom, a Wireless Telecom Group Company (NYSE American: WTT), announced the launch of the new RFX7000B programmable noise generator, a unique, compact form factor solution for automated testing environments and densely populated rackmount systems, which leverages the technology developed for the popular UFX7000A benchtop instrument. The new noise generator delivers value to test engineers and system integrators by providing performance, capabilities, and customizations previously available only in larger form factor benchtop products. The RFX7000B saves valuable space in complex rackmount systems found in semiconductor test environments, radar systems, and satellite ground stations.

“The RFX7000B is a direct result of the Noisecom commitment to customer-driven, highly customizable noise sources that deliver unique, application-specific solutions to the most challenging RF design and test problems. Our customers came to us looking for the superior performance and flexibility they expect from Noisecom but with unique, space-constrained system limitations, which we met by packaging our components in the new, slim RFX7000B platform,” says Dr. Lee McMillan, VP of Engineering and Manufacturing.

Designed for engineers and designers who need to create complex custom noise signals for advanced test systems in a tight rack mount environment, the RFX7000B provides noise generation capabilities up to 40 GHz in a compact 1U high form factor. The compact 1U form factor is ideal for rack-mounted production and automated testing environments or integrated systems used in satellite communications, radar, and signal and millimeter wave product testing. The RFX7000B  comes standard with a signal combiner and an attenuated signal path with a dynamic range of 127 dB in 0.1 dB steps, which allows independent control of the noise and signal paths to vary the signal-to-noise ratio during bit error rate testing. The instrument is controllable through standard LAN or USB rear panel connections and is available in a series of standard configurations that can be modified to support specific customer requirements. 

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