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Global Chip Developer Uses Noisecom VCC Solution to Integrate Noise Sources into Their Test System

Customer Success Story:

Test Division of Chip Development Group  uses Noisecom VCC solution to provide flexible and repeatable interference test stations to qualify chipsets.

Previous Situation:

Chip components need to be qualified for immunity to specific interference levels.

Problem or Challenge and its Impact:

Problem or Challenge and its Impact:  Test Division requires integrated noise sources for inclusion in their qualification test system and to minimize the need for their own engineers to build test equipment.

Alternative Approaches to Solve/Improve:

Alternative Approaches to Solve/Improve:  The only real alternative is to have test engineers build the noise source capability internally for multiple test stations, which is not an optimal use of their time.

Solution Implemented/Action Taken:

Solution Implemented/Actions Taken: The Noisecom JV9000 Series is configured to provide the necessary interference during chipset qualification.  Each instrument can be configured based on test requirements and integrated into multiple test stations.

Results/Impact:

Test Engineers can focus on performing repeatable component testing reliably, using factory-configurable Noisecom instruments rather than building and maintaining homegrown test systems.

Customer Quote:

"The instrument's capabilities will continue to insure that  we provide our customers with timing circuits that are of robust design."

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